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Refraction effects on x-ray and ultraviolet interferometric probing of laser-produced plasmas

dc.contributor.authorMarconi, Mario C., author
dc.contributor.authorFilevich, Jorge, author
dc.contributor.authorRocca, Jorge J., author
dc.contributor.authorShlyaptsev, Vyacheslav N., author
dc.contributor.authorHunter, James R., author
dc.contributor.authorNilsen, Joseph, author
dc.contributor.authorDunn, James, author
dc.contributor.authorSmith, Raymond F., author
dc.contributor.authorOptical Society of America, publisher
dc.date.accessioned2007-01-03T08:10:06Z
dc.date.available2007-01-03T08:10:06Z
dc.date.issued2003
dc.description.abstractWe present a study detailing the effects of refraction on the analysis and interpretation of line-of-site optical probe characterization techniques within laser-produced plasmas. Results using x-ray laser backlit grid deflectometry and ray-tracing simulations illustrate the extent to which refraction can be a limiting factor in diagnosing high-density, short-scale-length plasmas. Analysis is applied to a recent experiment in which soft x-ray interferometry was used to measure the electron density within a fast-evolving Al plasma. Comparisons are drawn between extreme ultraviolet and ultraviolet probe wavelengths.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationSmith, Raymond F., et al., Refraction Effects on X-Ray and Ultraviolet Interferometric Probing of Laser-Produced Plasmas, Journal of the Optical Society of America. B, Optical Physics 20, no. 1 (January 2003): 254-259.
dc.identifier.urihttp://hdl.handle.net/10217/67613
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©2003 Optical Society of America.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.titleRefraction effects on x-ray and ultraviolet interferometric probing of laser-produced plasmas
dc.typeText

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