Refraction effects on x-ray and ultraviolet interferometric probing of laser-produced plasmas

Abstract

We present a study detailing the effects of refraction on the analysis and interpretation of line-of-site optical probe characterization techniques within laser-produced plasmas. Results using x-ray laser backlit grid deflectometry and ray-tracing simulations illustrate the extent to which refraction can be a limiting factor in diagnosing high-density, short-scale-length plasmas. Analysis is applied to a recent experiment in which soft x-ray interferometry was used to measure the electron density within a fast-evolving Al plasma. Comparisons are drawn between extreme ultraviolet and ultraviolet probe wavelengths.