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Transient phase microscopy using balanced-detection temporal interferometry and a compact piezoelectric microscope design with sparse inpainting

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dc.contributor.authorColeal, Cameron N., author
dc.contributor.authorWilson, Jesse, advisor
dc.contributor.authorBartels, Randy, committee member
dc.contributor.authorLevinger, Nancy, committee member
dc.contributor.authorAdams, Henry, committee member
dc.date.accessioned2024-05-27T10:32:52Z
dc.date.available2025-05-20
dc.date.issued2024
dc.description.abstractTransient phase detection, which measures the Re{∆N }, is the complement to transient absorption detection (Im{∆N }). This work extends transient phase detection from spectroscopy to microscopy using a fast-galvanometer point-scanning setup and compares the trade-offs in transient phase versus transient absorption microscopy for the same pump and probe wavelengths. The realization of transient phase microscopy in conjunction with transient absorption microscopy opens a new door to measure the excited-state kinetics with phase-based or absorption-based techniques; depending on the sample and the wavelengths in use, transient phase detection may provide a signal improvement over transient absorption. Up until this point, transient phase microscopy has been a neglected technique in ultrafast pump-probe imaging applications. Additionally, this work evaluates a miniature piezoelectric actuator to replace galvanometers in a compact point-scanning microscope design. Sparsity limitations present in the design are addressed by the construction of a Fourier-projections based inpainting algorithm which could enable faster imaging acquisition in future applications.
dc.format.mediumborn digital
dc.format.mediumdoctoral dissertations
dc.identifierColeal_colostate_0053A_18283.pdf
dc.identifier.urihttps://hdl.handle.net/10217/238503
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartof2020-
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.rights.accessEmbargo expires: 05/20/2025.
dc.subjectinpainting
dc.subjectpump-probe
dc.subjectmicroscopy
dc.subjectconfocal
dc.titleTransient phase microscopy using balanced-detection temporal interferometry and a compact piezoelectric microscope design with sparse inpainting
dc.typeText
dcterms.embargo.expires2025-05-20
dcterms.embargo.terms2025-05-20
dcterms.rights.dplaThis Item is protected by copyright and/or related rights (https://rightsstatements.org/vocab/InC/1.0/). You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorColorado State University
thesis.degree.levelDoctoral
thesis.degree.nameDoctor of Philosophy (Ph.D.)

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