Transient phase microscopy using balanced-detection temporal interferometry and a compact piezoelectric microscope design with sparse inpainting
Date
2024
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Abstract
Transient phase detection, which measures the Re{∆N }, is the complement to transient absorption detection (Im{∆N }). This work extends transient phase detection from spectroscopy to microscopy using a fast-galvanometer point-scanning setup and compares the trade-offs in transient phase versus transient absorption microscopy for the same pump and probe wavelengths. The realization of transient phase microscopy in conjunction with transient absorption microscopy opens a new door to measure the excited-state kinetics with phase-based or absorption-based techniques; depending on the sample and the wavelengths in use, transient phase detection may provide a signal improvement over transient absorption. Up until this point, transient phase microscopy has been a neglected technique in ultrafast pump-probe imaging applications. Additionally, this work evaluates a miniature piezoelectric actuator to replace galvanometers in a compact point-scanning microscope design. Sparsity limitations present in the design are addressed by the construction of a Fourier-projections based inpainting algorithm which could enable faster imaging acquisition in future applications.
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Embargo expires: 05/20/2025.
Subject
inpainting
pump-probe
microscopy
confocal