Repository logo
 

The prospects of reflectometry and ellipsometry with Colorado State University tabletop XUV laser

Simple item page
dc.contributor.authorLebedev, P. N., author
dc.contributor.authorYamamoto, M., author
dc.contributor.authorVinogradov, A. V., author
dc.contributor.authorSeminario, M., author
dc.contributor.authorRocca, Jorge J., author
dc.contributor.authorFechtchenko, R. M., author
dc.contributor.authorBenware, B. R., author
dc.contributor.authorArtioukov, I. A., author
dc.contributor.authorEDP Sciences, publisher
dc.date.accessioned2007-01-03T08:09:55Z
dc.date.available2007-01-03T08:09:55Z
dc.date.issued2001
dc.description.abstractThe capillary discharge ArIX laser (wavelength 46.9nm) is a new device attractive for various applications due to its unique for XUV lasers properties: high average power and compactness. Reflectometry and ellipsometry are among them. The first is capable to provide fundamental data on optical constants of solids, which are still rather limited. Reflection coefficient in this spectral range is highly sensitive to the presence of an over layer at the surface of a sample. This hinders bulk optical constants determination, but offers the possibility to study chemical contamination by ambience. The theory of reflection from a surface with a thin overlayer is developed. It enables to rigorously include overlayer into reflectometry data processing and derive separately the parameters of bulk and overlayer. Ellipsometry in general is more powerful than reflectometry method to measure optical constants. In addition it offers the accurate methods to measure film thickness and properties of magnetic materials. Unfortunately high quality analyzers and polarizers are not available in this spectral range, which requires specific approach to ellipsometric measurements. We discuss and use for this purpose Sc/Si multilayer structures.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationArtioukov, I. A., et al., The Prospects of Reflectometry and Ellipsometry with Colorado State University Tabletop XUV Laser, Journal de Physique. IV, Colloque 11, no. Pr2 (2001): 451-457.
dc.identifier.urihttp://hdl.handle.net/10217/67488
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©2001 EDP Sciences.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.titleThe prospects of reflectometry and ellipsometry with Colorado State University tabletop XUV laser
dc.typeText

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
ECEjjr00038.pdf
Size:
305.27 KB
Format:
Adobe Portable Document Format
Description:
Download

Collections

Faculty Publications