Picosecond absorption dynamics of photoexcited InGaP epitaxial films
Date
1991
Authors
Thiagarajan, P., author
Schmerge, J. F., author
Menoni, Carmen S., author
Marconi, Mario Carlos, author
Martinez, Oscar Eduardo, author
Rocca, Jorge J., author
Hafich, M. J., author
Lee, H. Y., author
Robinson, G. Y., author
American Institute of Physics, publisher
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Abstract
The absorption recovery of a photoexcited InGaP epitaxial film 0.4 µm thick was investigated using the pump-probe laser technique and found to have a time constant of 55 ps at room temperature. Measurements done in the temperature range of 300-50 K show the decay of the photoexcited carrier distribution to be dominated by ambipolar diffusion and surface recombination. The measured absorption recovery time constant corresponds to an ambipolar diffusion coefficient D > 2.8 cm2/s and a surface recombination velocity of S > 4 × 105 cm/s at room temperature.
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Subject
indium phosphides
gallium phosphides
photoconductivity
optoelectronic devices
carrier density
ambipolar diffusion
atom transport
recombination
temperature dependence
ps range