Repository logo
 

A multiscale stochastic image model for automated inspection

Simple item page
dc.contributor.authorKhawaja, Khalid W., author
dc.contributor.authorBouman, Charles Addison, author
dc.contributor.authorTretter, Daniel, author
dc.contributor.authorMaciejewski, Anthony A., author
dc.contributor.authorIEEE, publisher
dc.date.accessioned2007-01-03T07:26:30Z
dc.date.available2007-01-03T07:26:30Z
dc.date.issued1995
dc.description.abstractIn this paper, we develop a novel multiscale stochastic image model to describe the appearance of a complex three-dimensional object in a two-dimensional monochrome image. This formal image model is used in conjunction with Bayesian estimation techniques to perform automated inspection. The model is based on a stochastic tree structure in which each node is an important subassembly of the three-dimensional object. The data associated with each node or subassembly is modeled in a wavelet domain. We use a fast multiscale search technique to compute the sequential MAP (SMAP) estimate of the unknown position, scale factor, and 2-D rotation for each subassembly. The search is carried out in a manner similar to a sequential likelihood ratio test, where the process advances in scale rather than time. The results of this search determine whether or not the object passes inspection. A similar search is used in conjunction with the EM algorithm to estimate the model parameters for a given object from a set of training images. The performance of the algorithm is demonstrated on two different real assemblies.
dc.description.sponsorshipThis work was supported by an AT&T Bell Laboratories Ph.D. Scholarship, the NEC corporation, National Science Foundation grant number MIP93-00560, and National Science Foundation grant number CDR 8803017 to the Engineering Research Center for Intelligent Manufacturing Systems.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationTretter, Daniel, et al., A Multiscale Stochastic Image Model for Automated Inspection, IEEE Transactions on Image Processing 4, no. 12 (December 1995): 1641-1654.
dc.identifier.urihttp://hdl.handle.net/10217/618
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©1995 IEEE.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectimage processing
dc.subjectautomatic optical inspection
dc.subjectBayes methods
dc.subjectmaximum likelihood estimation
dc.subjectsearch problems
dc.subjectsequential estimation
dc.subjectstochastic processes
dc.subjectwavelet transforms
dc.titleA multiscale stochastic image model for automated inspection
dc.typeText

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
ECEaam00020.pdf
Size:
2.12 MB
Format:
Adobe Portable Document Format
Description:
Download

Collections

Publications