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A multiscale stochastic image model for automated inspection

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dc.contributor.authorKhawaja, Khalid W., author
dc.contributor.authorBouman, Charles Addison, author
dc.contributor.authorTretter, Daniel, author
dc.contributor.authorMaciejewski, Anthony A., author
dc.contributor.authorIEEE, publisher
dc.date.accessioned2007-01-03T07:26:30Z
dc.date.available2007-01-03T07:26:30Z
dc.date.issued1995
dc.description.abstractIn this paper, we develop a novel multiscale stochastic image model to describe the appearance of a complex three-dimensional object in a two-dimensional monochrome image. This formal image model is used in conjunction with Bayesian estimation techniques to perform automated inspection. The model is based on a stochastic tree structure in which each node is an important subassembly of the three-dimensional object. The data associated with each node or subassembly is modeled in a wavelet domain. We use a fast multiscale search technique to compute the sequential MAP (SMAP) estimate of the unknown position, scale factor, and 2-D rotation for each subassembly. The search is carried out in a manner similar to a sequential likelihood ratio test, where the process advances in scale rather than time. The results of this search determine whether or not the object passes inspection. A similar search is used in conjunction with the EM algorithm to estimate the model parameters for a given object from a set of training images. The performance of the algorithm is demonstrated on two different real assemblies.
dc.description.sponsorshipThis work was supported by an AT&T Bell Laboratories Ph.D. Scholarship, the NEC corporation, National Science Foundation grant number MIP93-00560, and National Science Foundation grant number CDR 8803017 to the Engineering Research Center for Intelligent Manufacturing Systems.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationTretter, Daniel, et al., A Multiscale Stochastic Image Model for Automated Inspection, IEEE Transactions on Image Processing 4, no. 12 (December 1995): 1641-1654.
dc.identifier.urihttp://hdl.handle.net/10217/618
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©1995 IEEE.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectimage processing
dc.subjectautomatic optical inspection
dc.subjectBayes methods
dc.subjectmaximum likelihood estimation
dc.subjectsearch problems
dc.subjectsequential estimation
dc.subjectstochastic processes
dc.subjectwavelet transforms
dc.titleA multiscale stochastic image model for automated inspection
dc.typeText

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