Single-shot soft x-ray laser linewidth measurement using a grating interferometer
Date
2013-12-01
Authors
Wang, Y., author
Yin, L., author
Wang, S., author
Marconi, M. C., author
Dunn, J., author
Gullikson, E., author
Rocca, J. J., author
Optical Society of America, publisher
Journal Title
Journal ISSN
Volume Title
Abstract
The linewidth of a 14.7 nm wavelength Ni-like Pd soft x-ray laser was measured in a single shot using a soft x-ray diffraction grating interferometer. The instrument uses the time delay introduced by the gratings across the beam to measure the temporal coherence. The spectral linewidth of the 4d1S0-4p1P1 Ni-like Pd lasing line was measured to be Δλ/λ=3×10-5 from the Fourier transform of the fringe visibility. This single shot linewidth measurement technique provides a rapid and accurate way to determine the temporal coherence of soft x-ray lasers that can contribute to the development of femtosecond plasma-based soft x-ray lasers.
Description
Rights Access
Subject
Fourier transforms
laser amplifiers
laser sources
soft x rays
x ray interferometry
x ray lasers