Spontaneous emission factor in oxide confined vertical-cavity lasers
Date
1997
Authors
Hou, Hong Q., author
Lear, Kevin L., author
Temkin H., author
Kuksenkov, D. V., author
American Institute of Physics, publisher
Journal Title
Journal ISSN
Volume Title
Abstract
We report on measurements of the spontaneous emission factor for oxide-confined InGaAs vertical cavity surface emitting lasers. The spontaneous emission factor is determined as a function of the active layer volume from the measurement of small-signal harmonic distortion at threshold. For a 3×3 µm oxide aperture device we obtain spontaneous emission factor of 4.2• 10-2 at room temperature.
Description
Rights Access
Subject
semiconductor lasers
mode control
laser cavities
design
gallium arsenides
indium arsenides
emission spectra
infrared radiation
harmonics
apertures