Soft-x-ray interferometer for single-shot laser linewidth measurements
Chilla, Juan L. A., author
Martinez, Oscar E., author
Rocca, Jorge J., author
Marconi, Mario C., author
Optical Society of America, publisher
A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.