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Direct imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy

dc.contributor.authorLear, Kevin L., author
dc.contributor.authorDandy, David S., author
dc.contributor.authorStephens, Matthew D., author
dc.contributor.authorYuan, Guang Wei, author
dc.contributor.authorIEEE, publisher
dc.date.accessioned2007-01-03T04:42:37Z
dc.date.available2007-01-03T04:42:37Z
dc.date.issued2005
dc.description.abstractNear-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors.
dc.description.sponsorshipThis work was supported by the National Institutes of Health (NIH) under Grant EB00726.
dc.format.mediumborn digital
dc.format.mediumarticles
dc.identifier.bibliographicCitationYuan, Guang Wei, et al., Direct Imaging of Transient Interference in a Single-Mode Waveguide Using Near-Field Scanning Optical Microscopy, IEEE Photonics Technology Letters 17, no. 11 (November 2005): 2382-2384.
dc.identifier.urihttp://hdl.handle.net/10217/821
dc.languageEnglish
dc.language.isoeng
dc.publisherColorado State University. Libraries
dc.relation.ispartofFaculty Publications
dc.rights©2005 IEEE.
dc.rightsCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.
dc.subjectwaveguide
dc.subjectevanescent field
dc.subjectleaky mode
dc.subjectnear-field scanning optical microscopy (NSOM)
dc.subjectbiosensor
dc.subjectoptical interference
dc.titleDirect imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy
dc.typeText

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