A multiscale assembly inspection algorithm
| dc.contributor.author | Bouman, Charles Addison, author | |
| dc.contributor.author | Tretter, Daniel, author | |
| dc.contributor.author | Maciejewski, Anthony A., author | |
| dc.contributor.author | Khawaja, Khalid W., author | |
| dc.contributor.author | IEEE, publisher | |
| dc.date.accessioned | 2007-01-03T07:26:31Z | |
| dc.date.available | 2007-01-03T07:26:31Z | |
| dc.date.issued | 1996 | |
| dc.description.abstract | An important aspect of robust automated assembly is an accurate and efficient method for the inspection of finished assemblies. This novel algorithm is trained on synthetic images generated using the CAD model of the different components of the assembly. Once trained on synthetic images, the algorithm can detect assembly errors by examining real images of the assembled product. | |
| dc.description.sponsorship | This work was supported by the NEC Corporation, National Science Foundation grant number CDR8803017 to the Engineering Research Center for Intelligent Manufacturing Systems, National Science Foundation grant number MIP93-00560, and an AT&T Bell Laboratories Ph.D. Scholarship. | |
| dc.format.medium | born digital | |
| dc.format.medium | articles | |
| dc.identifier.bibliographicCitation | Khawaja, Khalid W., et al., A Multiscale Assembly Inspection Algorithm, IEEE Robotics and Automation Magazine 3, no. 2 (June 1996): 15-22. | |
| dc.identifier.uri | http://hdl.handle.net/10217/621 | |
| dc.language | English | |
| dc.language.iso | eng | |
| dc.publisher | Colorado State University. Libraries | |
| dc.relation.ispartof | Faculty Publications | |
| dc.rights | ©1996, IEEE. | |
| dc.rights | Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright. | |
| dc.subject | learning systems | |
| dc.subject | visual databases | |
| dc.subject | CAD | |
| dc.subject | assembling | |
| dc.subject | object detection | |
| dc.subject | automatic optical inspection | |
| dc.subject | computer graphics | |
| dc.title | A multiscale assembly inspection algorithm | |
| dc.type | Text |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- ECEaam00025.pdf
- Size:
- 1.49 MB
- Format:
- Adobe Portable Document Format
- Description: