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    ReSi2 thin-film infrared detectors

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    http://hdl.handle.net/10217/67935
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    ECEjem00012.pdf (82.29Kb)
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    Abstract
    Two types of thin-film infrared-sensing devices have been investigated using the narrow band-gap semiconductor, rhenium disilicide (Eg~0.1 eV). These are the ReSi2/n-Si heterojunction internal photoemission (HIP) detector and the ReSi2 thin-film photoconductor. The HIP device was found to be rectifying and to obey a Fowler-type law with a long-wavelength cutoff of ~2.1 μm (0.59 eV) at room temperature. In hopes of approaching the fundamental limit for a ReSi2-based photonic detector, ~12 μm (0.1 eV), the ReSi2 photoconductor was explored. Indeed, the spectral response (measured at 10 K) of the ...
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    Author(s)
    Mahan, John E.; Becker, James P.; Long, Robert G.

    Date Issued
    1995
    Format
    born digital; articles
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    • Faculty Publications - Department of Electrical and Computer Engineering

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