Soft-x-ray interferometer for single-shot laser linewidth measurements
Date
1996
Authors
Chilla, Juan L. A., author
Martinez, Oscar E., author
Rocca, Jorge J., author
Marconi, Mario C., author
Optical Society of America, publisher
Journal Title
Journal ISSN
Volume Title
Abstract
A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.