Modelling thin-film transistors for understanding material properties and improving electronic device performance
As new materials continue to develop through theoretical and experimental findings, it is desirable to have a reliable method of testing the materials to better understand their unique properties. Reliable computer modelling of electronic devices composed of these materials provides an inexpensive means of determining how a material will perform. Here we demonstrate the use of a computer software to accurately model electronic devices. We focus on amorphous silicon thin-film transistors and relate what is observed computationally to published experimental and theoretical results. We show that ...
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