Lear, Kevin L., authorAl-Sowayan, S., authorIEEE, publisher2007-01-032007-01-032004Al-Sowayan, S. and K. L. Lear, Data Pattern Dependence of VCSEL Far-Field Distributions, IEEE Photonics Technology Letters 16, no. 10 (October 2004): 2215-2217.http://hdl.handle.net/10217/820The far field divergence angle distribution of vertical-cavity surface-emitting lasers is found to exhibit dependence on the data pattern driving the lasers. Two 50% duty cycle 1.25-Gb/s data patterns chosen to cause the same thermal conditions but with frequency content differing by a factor of 16 resulted in changes in the beam profile distributions with up to a 30% power variation in the central on-axis portion of the beam. Examination of the temporal waveforms as a function of far field angle revealed overshoot in the on-axis power and undershoot in the off-axis portion of the beam.born digitalarticleseng©2004 IEEE.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.far fielddata pattern dependentbeam divergencelaser diodemultimode fiber opticData pattern dependence of VCSEL far-field distributionsText