Coleal, Cameron N., authorWilson, Jesse, advisorBartels, Randy, committee memberLevinger, Nancy, committee memberAdams, Henry, committee member2024-05-272025-05-202024https://hdl.handle.net/10217/238503Transient phase detection, which measures the Re{∆N }, is the complement to transient absorption detection (Im{∆N }). This work extends transient phase detection from spectroscopy to microscopy using a fast-galvanometer point-scanning setup and compares the trade-offs in transient phase versus transient absorption microscopy for the same pump and probe wavelengths. The realization of transient phase microscopy in conjunction with transient absorption microscopy opens a new door to measure the excited-state kinetics with phase-based or absorption-based techniques; depending on the sample and the wavelengths in use, transient phase detection may provide a signal improvement over transient absorption. Up until this point, transient phase microscopy has been a neglected technique in ultrafast pump-probe imaging applications. Additionally, this work evaluates a miniature piezoelectric actuator to replace galvanometers in a compact point-scanning microscope design. Sparsity limitations present in the design are addressed by the construction of a Fourier-projections based inpainting algorithm which could enable faster imaging acquisition in future applications.born digitaldoctoral dissertationsengCopyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.inpaintingpump-probemicroscopyconfocalTextEmbargo expires: 05/20/2025.