Wang, Y., authorYin, L., authorWang, S., authorMarconi, M. C., authorDunn, J., authorGullikson, E., authorRocca, J. J., authorOptical Society of America, publisher2020-04-282020-04-282013-12-01Y. Wang, L. Yin, S. Wang, M. C. Marconi, J. Dunn, E. Gullikson, and J. J. Rocca, "Single-shot soft x-ray laser linewidth measurement using a grating interferometer," Opt. Lett. 38, 5004-5007 (2013). https://doi.org/10.1364/OL.38.005004https://hdl.handle.net/10217/206013The linewidth of a 14.7 nm wavelength Ni-like Pd soft x-ray laser was measured in a single shot using a soft x-ray diffraction grating interferometer. The instrument uses the time delay introduced by the gratings across the beam to measure the temporal coherence. The spectral linewidth of the 4d1S0-4p1P1 Ni-like Pd lasing line was measured to be Δλ/λ=3×10-5 from the Fourier transform of the fringe visibility. This single shot linewidth measurement technique provides a rapid and accurate way to determine the temporal coherence of soft x-ray lasers that can contribute to the development of femtosecond plasma-based soft x-ray lasers.born digitalarticleseng©2013 Optical Society of America. Under the terms of the OSA Open Access Publishing Agreement. Biomedical Optics Express, Optica, Optical Materials Express, Optics Express, and OSA Continuum are all gold open access journals. As a result of the authors paying an article processing charge (APC), all content published in these journals is freely available.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.Fourier transformslaser amplifierslaser sourcessoft x raysx ray interferometryx ray lasersSingle-shot soft x-ray laser linewidth measurement using a grating interferometerTexthttps://doi.org/10.1364/OL.38.005004