Chilla, Juan L. A., authorMartinez, Oscar E., authorRocca, Jorge J., authorMarconi, Mario C., authorOptical Society of America, publisher2007-01-032007-01-031996Chilla, Juan L. A., et al., Soft-X-Ray Interferometer for Single-Shot Laser Linewidth Measurements, Optics Letters 21, no. 13 (July 1, 1996): 955-957.http://hdl.handle.net/10217/67588A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.born digitalarticleseng©1996 Optical Society of America.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.Text