Tufts, Donald W., authorScharf, Louis L., authorThomas, John K., authorIEEE, publisher2007-01-032007-01-031995Thomas, John K., Louis L. Scharf, and Donald W. Tufts, The Probability of a Subspace Swap In the SVD, IEEE Transactions on Signal Processing 43, no. 3 (March 1995): 730-736.http://hdl.handle.net/10217/751In this paper we extend the work of Tufts, Kot, and Vaccaro (TKV) to improve the analytical characterization of threshold breakdown in SVD methods. Our results sharpen the TKV results by lower bounding the probability of a subspace swap in the SVD. Our key theoretical result is the characteristic function for a random variable whose probability of exceeding zero bounds the probability of a threshold breakdown.born digitalarticleseng©1995 IEEE.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.random processesprobabilityparameter estimationsignal resolutionsingular value decompositionText