Lear, Kevin L., authorDandy, David S., authorStephens, Matthew D., authorYuan, Guang Wei, authorIEEE, publisher2007-01-032007-01-032005Yuan, Guang Wei, et al., Direct Imaging of Transient Interference in a Single-Mode Waveguide Using Near-Field Scanning Optical Microscopy, IEEE Photonics Technology Letters 17, no. 11 (November 2005): 2382-2384.http://hdl.handle.net/10217/821Near-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors.born digitalarticleseng©2005 IEEE.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.waveguideevanescent fieldleaky modenear-field scanning optical microscopy (NSOM)biosensoroptical interferenceText