Shlyaptsev, Vyacheslav N., authorHunter, James R., authorKeenan, Roisin, authorSmith, Raymond F., authorDunn, James, authorScofield, J. H., authorNilsen, Joseph, authorMoon, Stephen J., authorMarconi, Mario Carlos, authorRocca, Jorge, J., authorFilevich, Jorge, authorElsevier Ltd., publisher2007-01-032007-01-032006Filvich, J., et al., Observation of Multiply Ionized Plasmas with Dominant Bound Electron Contribution to the Index of Refraction, Journal of Quantitative Spectroscopy and Radiative Transfer 99, no. 1-3 (May-June 2006): 165-174.http://hdl.handle.net/10217/2129We report anomalous fringe shifts observed in soft X-ray laser interferograms of laser-created Al plasmas. This clear experimental evidence shows that the contribution of bound electrons can dominate the index of refraction of laser-created plasmas at soft X-ray wavelengths, resulting in values greater than 1. The comparison of measured and simulated interferograms shows that this results from the dominant contribution of low-charge ions to the index of refraction. This usually neglected bound electron contribution can affect the propagation of soft X-ray radiation in plasmas and the interferometric diagnostics of plasmas for many elements.born digitalarticleseng©2006 Elsevier Ltd.Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright.interferometrysoft x-ray laserindex of refractionplasmasanomalous dispersionText