Far Field Observation and Theoretical Analyses of Light Directional Imaging in Metamaterial with Stacked Metal-Dielectric Films
We report experimental observation of directional imaging of evanescent waves in layered metal-dielectric metamaterial. The investigation is performed with Ag/SiO2 multilayers combined with nano-object featured by a silicon mask slit. Evanescent waves of directional imaging are transferred to far field by roughening the top Ag layer and observed with a microscope objective. Experimental results agree well with numerical simulations. In addition, directional imaging behavior dependences on geometrical parameters are further presented and show great deviations with effective medium theory in some cases.
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