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Modelling thin-film transistors for understanding material properties and improving electronic device performance
Author(s):Schenken, William K.; Airuoyo, Idemudia; Collins, Reuben T.; Colorado School of Mines. McBride Honors Program
As new materials continue to develop through theoretical and experimental findings, it is desirable to have a reliable method of testing the materials to better understand their unique properties. Reliable computer modelling ...