Efficient multidimensional uncertainty quantification of high speed circuits using advanced polynomial chaos approaches
With the scaling of VLSI technology to sub-45 nm levels, uncertainty in the nanoscale manufacturing processes and operating conditions have been found to result in unpredictable circuit behavior at the chip, package, and board levels of modern integrated microsystems. Hence, modeling the forward propagation of uncertainty from the device-level parameters to the system-level response of high-speed circuits and systems forms a crucial requirement of modern computer-aided design (CAD) tools. This thesis presents novel approaches based on the generalized polynomial chaos (gPC) theory for the efficient ...
(For more, see "View full record.")