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    Atomic force microscopy: more than surface imaging 

    Author(s):Bishop, Terrance Tyler
    Date Issued:2020
    Format:born digital; masters theses
    Atomic Force Microscopy (AFM) is a powerful imaging tool that has capabilities that go beyond the abilities of most other microscopes. Here, three examples of these capabilities were considered. First, the AFM was operated ...

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    Bishop, Terrance Tyler (1)
    Subjectatomic (1)colloidal (1)force (1)Hertzian (1)microscopy (1)... View MoreDate Issued2020 (1)Has File(s)Yes (1)

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