• Total and differential sputter yields of boron nitride 

        Author(s):Topper, James Leo IV
        Date Issued:2011
        Format:born digital; masters theses
        A quartz crystal microbalance (QCM) based system was used to measure total and differential sputter yields of Boron Nitride targets due to Xenon ion bombardment. The system used a four-grid ion source to generate a (nearly) ...