• Recent developments in X-UV optics and X-UV diagnostics 

        Author(s):Levecq, X.; Valentin, C.; Troussel, P.; Smith, R. F.; Rocca, Jorge J.; Rémond, C.; Ravet, M. F.; Naulleau, P. P.; Morlend, A. S.; Mercère, P.; Marmoret, R.; Lewis, C. L. S.; Vanbostal, L.; Le Pape, S.; Kazamias, S.; Jacquemot, S.; Idir, M.; Hunter, J. R.; Hubert, S.; Goldberg, K. A.; Fajardo, M.; Faivre, G.; Dunn, J.; Douillet, D.; Dovillaire, G.; Delmotte, F.; Bucourt, S.; Balcou, Ph.; Zeitoun, Ph.
        Date Issued:2004
        Format:born digital; articles
        Metrology of XUV beams (X-ray lasers, high-harmonic generation and VUV free-electron lasers) is of crucial importance for the development of applications. We have thus developed several new optical systems enabling us to ...
      • Electromagnetic-field distribution measurements in the soft s-ray range: full characterization of a soft x-ray laser beam 

        Author(s):François, M.; Rocca, Jorge J.; Dhez, P.; Idir, M.; Aeitoun, Ph.; Le Pape, S.
        Date Issued:2002
        Format:born digital; articles
        We report direct measurement of the electromagnetic-field spatial distribution in a neonlike Ar capillary discharge-driven soft x-ray laser beam. The wave front was fully characterized in a single shot using a Shack-Hartmann ...